Advanced Certificate in Semiconductor Mixed-Signal Test
-- ViewingNowThe Advanced Certificate in Semiconductor Mixed-Signal Test is a comprehensive course designed for professionals seeking to enhance their skills in the semiconductor industry. This course emphasizes the importance of mixed-signal testing, a critical process in semiconductor manufacturing, ensuring the functionality and reliability of circuits.
4,183+
Students enrolled
GBP £ 140
GBP £ 202
Save 44% with our special offer
ใใฎใณใผในใซใคใใฆ
100%ใชใณใฉใคใณ
ใฉใใใใงใๅญฆ็ฟ
ๅ ฑๆๅฏ่ฝใช่จผๆๆธ
LinkedInใใญใใฃใผใซใซ่ฟฝๅ
ๅฎไบใพใง2ใถๆ
้ฑ2-3ๆ้
ใใคใงใ้ๅง
ๅพ ๆฉๆ้ใชใ
ใณใผใน่ฉณ็ดฐ
โข Advanced Mixed-Signal Test Techniques: This unit will cover the latest test techniques for mixed-signal semiconductors, including advanced digital and analog test methods. โข Semiconductor Test Equipment: This unit will explore the various types of test equipment used in semiconductor mixed-signal testing, such as oscilloscopes, logic analyzers, and source measure units. โข Mixed-Signal Test Pattern Generation: This unit will focus on the generation of test patterns for mixed-signal semiconductors, including the use of industry-standard tools and techniques. โข Semiconductor Test Automation: This unit will cover the automation of semiconductor mixed-signal testing, including the use of automated test equipment (ATE) and test program development. โข Mixed-Signal Circuit Design for Testability: This unit will explore the design of mixed-signal circuits for testability, including built-in self-test (BIST) and design-for-test (DFT) techniques. โข Data Analysis for Mixed-Signal Test: This unit will cover the analysis of data generated during mixed-signal semiconductor testing, including statistical analysis and fault diagnosis. โข Semiconductor Package and Board Test: This unit will explore the testing of semiconductor packages and printed circuit boards (PCBs) containing mixed-signal semiconductors. โข Reliability Testing for Mixed-Signal Semiconductors: This unit will focus on the reliability testing of mixed-signal semiconductors, including highly accelerated life testing (HALT) and highly accelerated stress testing (HAST). โข Advanced Mixed-Signal Test Challenges and Trends: This unit will cover the latest challenges and trends in mixed-signal semiconductor testing, including the impact of emerging technologies such as AI and IoT.
ใญใฃใชใขใใน
ๅ ฅๅญฆ่ฆไปถ
- ไธป้กใฎๅบๆฌ็ใช็่งฃ
- ่ฑ่ชใฎ็ฟ็ๅบฆ
- ใณใณใใฅใผใฟใผใจใคใณใฟใผใใใใขใฏใปใน
- ๅบๆฌ็ใชใณใณใใฅใผใฟใผในใญใซ
- ใณใผในๅฎไบใธใฎ็ฎ่บซ
ไบๅใฎๆญฃๅผใช่ณๆ ผใฏไธ่ฆใใขใฏใปใทใใชใใฃใฎใใใซ่จญ่จใใใใณใผในใ
ใณใผใน็ถๆณ
ใใฎใณใผในใฏใใญใฃใชใข้็บใฎใใใฎๅฎ็จ็ใช็ฅ่ญใจในใญใซใๆไพใใพใใใใใฏ๏ผ
- ่ชๅฏใใใๆฉ้ขใซใใฃใฆ่ชๅฎใใใฆใใชใ
- ่ชๅฏใใใๆฉ้ขใซใใฃใฆ่ฆๅถใใใฆใใชใ
- ๆญฃๅผใช่ณๆ ผใฎ่ฃๅฎ
ใณใผในใๆญฃๅธธใซๅฎไบใใใจใไฟฎไบ่จผๆๆธใๅใๅใใพใใ
ใชใไบบใ ใใญใฃใชใขใฎใใใซ็งใใกใ้ธใถใฎใ
ใฌใใฅใผใ่ชญใฟ่พผใฟไธญ...
ใใใใ่ณชๅ
ใณใผในๆ้
- ้ฑ3-4ๆ้
- ๆฉๆ่จผๆๆธ้ ้
- ใชใผใใณ็ป้ฒ - ใใคใงใ้ๅง
- ้ฑ2-3ๆ้
- ้ๅธธใฎ่จผๆๆธ้ ้
- ใชใผใใณ็ป้ฒ - ใใคใงใ้ๅง
- ใใซใณใผในใขใฏใปใน
- ใใธใฟใซ่จผๆๆธ
- ใณใผในๆๆ
ใณใผในๆ ๅ ฑใๅๅพ
ไผ็คพใจใใฆๆฏๆใ
ใใฎใณใผในใฎๆฏๆใใฎใใใซไผ็คพ็จใฎ่ซๆฑๆธใใชใฏใจในใใใฆใใ ใใใ
่ซๆฑๆธใงๆฏๆใใญใฃใชใข่จผๆๆธใๅๅพ